发明名称 METHOD FOR PHOTOLITHOGRAPHIC PATTERN GENERATION IN A PHOTORESIST LAYER
摘要 With the method, in which the photoresist is exposed to radiation more than once, a hole pattern corresponding to the pattern of openings (15, 16) of an exposure mask (14) as well as a hole pattern corresponding to the negative of the pattern of openings (28, 29, 30) of another exposure mask (25) are sequentially produced ink a single photoresist layer (12). The method is used e.g. in forming holes (23, 24) defined by the positive image into an oxide layer (11) on a substrate (10), and in producing a metallization pattern (36a, 36b) defined by the negative image for interconnecting areas of the substrate (10).
申请公布号 DE3271354(D1) 申请公布日期 1986.07.03
申请号 DE19823271354 申请日期 1982.07.27
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ABRAHAMOVICH, KAREN MARIE;HAMEL, CLIFFORD JOSEPH;PAYNE, EDWARD HENRY;WEED, DEAN ROBERT
分类号 H01L21/30;G03F7/00;G03F7/20;G03F7/26;H01L21/027;H01L21/306;(IPC1-7):H01L21/312;H01L21/308 主分类号 H01L21/30
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