发明名称 Semiconductor wafer dicing machine.
摘要 <p>@ A dicing machine for cutting a semiconductor wafer (W) along cutting lines arranged in a lattice pattern. The dicing machine comprises a cutting station (2), at least one alignment station (4A, 4B), a cutting means (8) disposed in the cutting station, a detecting means (10A, 108) disposed in the alignment station for detecting the cutting lines of the water (W), and a wafer transferring means (6). The wafer transferring means includes two wafer supporting means (50A, 5;B) and the dicing machine is capable of positioning one of the two wafer supporting means in the alignment station and performing alignment of a semiconductor wafer (W) supported with said one of the wafer supporting means while positioning the other of the wafer supporting means in the cutting station and cutting a semiconductor wafer supported with said the other of the supporting means by the cutting means. The cutting means includes two cutting blades (158A, 158B) and a cutting blade interval setting-up means (122) for setting up the interval of these cutting blades.</p>
申请公布号 EP0186201(A2) 申请公布日期 1986.07.02
申请号 EP19850116581 申请日期 1985.12.27
申请人 DISCO ABRASIVE SYSTEMS, LTD. 发明人 ONO, TAKATOSHI
分类号 H01L21/145;B27B31/06;B28D5/00;B28D5/02;(IPC1-7):H05K13/00 主分类号 H01L21/145
代理机构 代理人
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