发明名称 Method of forming resist pattern.
摘要 <p>A method for forming a resist pattern comprises the steps of coating a resist on a substrate (12), baking the resist, selectively radiating electromagnetic waves or particle rays onto a surface of the resist, and developing the resist. The method further comprises, after the baking step and before the developing step, the step of cooling the resist in such a manner that a temperature control plate (8) is disposed parallel to and adjacent to the substrate (12).</p>
申请公布号 EP0185366(A2) 申请公布日期 1986.06.25
申请号 EP19850116113 申请日期 1985.12.17
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 MATSUOKA, YASUO;TSUCHIYA, TAKASHI
分类号 G03F7/26;G03F7/38;G03F7/40;(IPC1-7):G03F7/26 主分类号 G03F7/26
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