发明名称 SENSITIVITY INDICATOR FOR DETECTING DEFECT BY RADIATION INSPECTION
摘要 An indicator for determining the sensitivity of a radiological defect testing device which simulates plane defects within a workpiece. Two or more tapered elements are placed side by side on a support such that parallel, adjacent sides define the plane defects. The elements are oriented such that the plane defect extends generally parallel to the direction of the radiation.
申请公布号 JPS61138151(A) 申请公布日期 1986.06.25
申请号 JP19850265949 申请日期 1985.11.26
申请人 SOC NATL ETUD CONSTR MOT AVIAT <SNECMA> 发明人 JIERAARU IBU MANJIYUNE;JIYAN PERIYUTSUKU;JIYAN FUERUNAN BUAERUMAN
分类号 G01N23/18 主分类号 G01N23/18
代理机构 代理人
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