发明名称 |
SENSITIVITY INDICATOR FOR DETECTING DEFECT BY RADIATION INSPECTION |
摘要 |
An indicator for determining the sensitivity of a radiological defect testing device which simulates plane defects within a workpiece. Two or more tapered elements are placed side by side on a support such that parallel, adjacent sides define the plane defects. The elements are oriented such that the plane defect extends generally parallel to the direction of the radiation. |
申请公布号 |
JPS61138151(A) |
申请公布日期 |
1986.06.25 |
申请号 |
JP19850265949 |
申请日期 |
1985.11.26 |
申请人 |
SOC NATL ETUD CONSTR MOT AVIAT <SNECMA> |
发明人 |
JIERAARU IBU MANJIYUNE;JIYAN PERIYUTSUKU;JIYAN FUERUNAN BUAERUMAN |
分类号 |
G01N23/18 |
主分类号 |
G01N23/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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