发明名称 SUCCESSIVE RE-INSPECTION AND DISCRIMINATION METHOD OF ANALYSER
摘要 PURPOSE:To suppress an error and economical loss to a min. degree, by performing statistical discrimination to measured data one after another in a real time and detecting the mistake of a specimen or the abnormality of an analyser at an early stage. CONSTITUTION:Plural measured data X of an analyser are inputted to a re- inspection and discrimination means 1 to which a limit value discrimination means 2 and a sum-of-product operation means 3 are provided. The discrimina tion means 2 compares measured data X (x1-xn) of each item and a limit value G (g1-gn) preset at every inspection item every time each item is inspected. When said measured data is fallen in the limit value, the measured data from the discrimination means are inputted to the sum-of-product operation means 3 which, in turn, statistically perform sum-of-product operation using the predetermined linear discrimination function C (c1-cn) to the input data on the basis of a predetermined formula in a real time. The normality, abnormal ity and the requirement of re-inspection of measured data are estimated and discriminated and the results are respectively outputted.
申请公布号 JPS61137065(A) 申请公布日期 1986.06.24
申请号 JP19840257405 申请日期 1984.12.07
申请人 TOSHIBA CORP 发明人 OKAMOTO YUZO
分类号 G01N35/02;G01N35/00 主分类号 G01N35/02
代理机构 代理人
主权项
地址