| 摘要 |
PURPOSE:To enable to securely monitor the strength of emission light, by a method wherein a semiconductor element which transforms the strength of emission light to electric signal is provided on the light path of emission light which emits outside from the semiconductor light element. CONSTITUTION:The light semiconductor element 9 is situated on the light path of emission light A from the front of the lighting element 1, and it penetrates the most part of emission light A as well as absorbs a part of it and transforms the strength of emission light to electric signals. Even if the lighting element 1 does not emit emission light B from the back surface, since the light semiconductor element 9 directly monitors emission light A emitting outward as light signal source, monitoring signals can be surely received. The absorption of a part of emission light A by the light semiconductor element 9 is corrected by the control of the emission light A output level. |
