发明名称 MEASURING METHOD OF OSCILLATING THRESHOLD CURRENT OF SEMICONDUCTOR LASER
摘要 PURPOSE:To shorten an aging time largely, and to simplify screen by changing radio waves applied to a semiconductor laser, obtaining a current value, in which an optical output from a laser reaches the maximum of a secondary difference section by currents, and using the current value as the oscillating threshold currents of the laser. CONSTITUTION:An optical output L from a laser is measured while varying currents I applied to a semiconductor laser, and a current I-optical-output L characteristic curve 3 shown in the graph is obtained. A secondary difference section curve 10 by currents I by the curve 3 is acquired, a current value (b) at a point 11 representing the maximum value in the curve 10 is obtained, and the current value (b) is employed as oscillating threshold currents Ith. Consequently, oscillating threshold currents Ith can be settled at one value to one semiconductor laser. Accordingly, oscillating threshold currents can be fixed at a physical significant one value to one semiconductor laser, thus making an aging time in screening largely shorter than conventional devices, then simplifying screening.
申请公布号 JPS61135175(A) 申请公布日期 1986.06.23
申请号 JP19840256992 申请日期 1984.12.05
申请人 FUJITSU LTD 发明人 TABUCHI HARUHIKO
分类号 H01S5/042;H01S5/00;H01S5/068 主分类号 H01S5/042
代理机构 代理人
主权项
地址
您可能感兴趣的专利