| 发明名称 |
LOW FREQUENCY ACOUSTIC MICROSCOPE |
| 摘要 |
The method of detecting near-surface flaws, inclusion or voids at plane (16) in a solid sample (13) by detecting acoustic energy specularly reflected and mode converted at the surface of the sample and reflected from flaws, inclusions or voids and forming an interference signal. |
| 申请公布号 |
WO8603588(A1) |
申请公布日期 |
1986.06.19 |
| 申请号 |
WO1985US02418 |
申请日期 |
1985.12.11 |
| 申请人 |
THE BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIO |
发明人 |
KHURI-YAKUB, BUTRUS, THOMAS |
| 分类号 |
G01N29/06;(IPC1-7):G01N29/04 |
主分类号 |
G01N29/06 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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