发明名称 METHOD OF DETECTING ABNORMAL UNIT CELL IN LAMINATED CELL
摘要 PURPOSE:To surely detect an abnormal unit cell even in the fluctuation of a load by comparing the internal resistance of a unit cell with the magnitude of a set value which is abnormal judging reference. CONSTITUTION:Voltage detectors 3c, 4c, 5c... are connected to both ends 3a-3b, 4a-4b, 5a-5b... of each unit cell in a laminated cell 20, and a current detector 22 is provided in series between the output terminal of the laminated cell 20 and a load 26. Detected voltage and detected current are fed to an arithmetical unit 27 to operate the internal resistance of the unit cell, and the internal resistance value is compared with the set value of a setter 25 by means of a comparator 24. If the deviation between the detected value and the comparative reference value is within an allowable value, the cell is judged as a normal state. It is possible to detect the existence of abnormality of the unit cell in a state of supplying voltage and current to the load, and even when there is any fluctuation of the load, it is possible to correctly detect the abnormality of the unit cell irrespective of the fluctuation of the load.
申请公布号 JPS61131373(A) 申请公布日期 1986.06.19
申请号 JP19840250556 申请日期 1984.11.29
申请人 HITACHI LTD 发明人 KOYAMA KAZUHITO;SUGITA NARIHISA;SAKAGUCHI HARUICHIRO;SHIINA KOJI;NOGUCHI YOSHIKI
分类号 H01M8/04 主分类号 H01M8/04
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