发明名称 PROCESS FOR FORMING DIFFUSION REGIONS IN A SEMICONDUCTOR SUBSTRATE
摘要 <p>In a process for forming diffusion regions (12) in a semiconductor substrate (40), trenches (43) are formed in the substrate surface, a doped insulator layer (49) is formed over the substrate surface including the sidewalls (46) and floors (47) of the trenches and an anisotropic etch is utilized to remove the doped insulator material except for sidewall sections (49V) on the trench sidewalls (46). Next, a heating step is effective to drive dopant from the sidewall sections (49V) into the semiconductor substrate (40) thereby forming thin diffusion regions (12) adjacent the trench sidewalls (46). The trenches are then filled with dielectric material (51). The diffusion regions (12) can be utilized as narrow channel stops for CMOS structures in the substrate (40).</p>
申请公布号 WO1986003620(A2) 申请公布日期 1986.06.19
申请号 US1985002302 申请日期 1985.11.25
申请人 发明人
分类号 主分类号
代理机构 代理人
主权项
地址