发明名称 TEST SYSTEM FOR SINGLE UNIT PROGRAM
摘要 PURPOSE:To improve the developing efficiency of a program by providing a memory to a test back-up tool which replaces modules to start a module to be tested after the test data is set or setting and delivering the module during its test. CONSTITUTION:A test back-up tool 13 is provided to a processor 1 connected to a console 3 in addition to a module analysis function 11 and COBOL compiler 12. An operating system 10 controls these function 11, compiler 12 and tool 13 respectively. A test data file 24 is provided to a file memory 2 and then connected to the tool 13. The test data on the module to be tested is stored in the file 24 and the tool 13 is started. A parameter delivery area is secured in an internal memory of the processor 1 if a high-order module exists. Then the data is set to start a test. While said delvery area is secured in the internal memory when no low-order load module exists. Then the data is set through the file 24 and used as the output data of low-order module.
申请公布号 JPS61127044(A) 申请公布日期 1986.06.14
申请号 JP19840250174 申请日期 1984.11.27
申请人 FUJITSU LTD 发明人 YANAGISAWA MINORU
分类号 G06F9/45;G06F9/44;G06F11/28;G06F11/36 主分类号 G06F9/45
代理机构 代理人
主权项
地址