发明名称 DIGITAL PATTERN TESTER
摘要 PURPOSE:To switch a reference clock signal and a digital pattern signal continuously by providing a basic clock generating circuit with the 1st and the 2nd clock data registers, and storing clock data in one register and outputting a basic clock signal from the other. CONSTITUTION:The basic clock generating circuit 30 is provided with the 1st address registers 31 and 32 and the 2nd address registers 34 and 35 to be stored with clock data, which are stored in them alternately according to an address alternation signal from a pattern generating circuit 20. Further, the basic clock signal is outputted according to the clock data stored in the clock data registers 31 and 32 and clock data for a next basic clock are stored in other clock data registers 34 and 35. Consequently, while the digital pattern signal is generated continuously, the clock rate of the basic clock signal is variable.
申请公布号 JPS61126482(A) 申请公布日期 1986.06.13
申请号 JP19840248962 申请日期 1984.11.26
申请人 YOKOGAWA ELECTRIC CORP 发明人 AGATA TATSUYUKI;UOZUMI TOMOHIKO
分类号 G01R31/28;G01R31/319 主分类号 G01R31/28
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