| 摘要 |
1,052,542. Electron beam apparatus. COMPAGNIE D'APPLICATIONS MECANIQUES A L'ELECTRONIQUE, AU CINEMA ET A L'ATOMISTIQUE (C.A.M.E.C.A.). Jan. 19, 1965 [Jan. 21, 1964], No. 2387/65. Heading H1D. In an electron beam microanalyser the specimen chamber 2 is supported on a plate 8 which is pivotally mounted at 9 on a slider (not shown) which is free to move within a sleeve 23. The sleeve 23 at the end of a bracket 5 which can slide on a post 6 and can also swing about it. The system can thus be swung from the position shown in which the system rests on a truncated boss 16 to a position out of the plane of the paper in which plane the system can be allowed to drop slightly so as to be supported by the bracket 5 on the base-plate 7. The specimen can then be changed. After changing the specimen the system can be swung back and moved upwardly on to the boss 16 to the position shown. By moving the system upwards the top of the specimen chamber 2 is brought into sealing contact with the main body 3 of the analyzer. To move the chamber upwards a pin 13 fixed to the slider within the bracket 23 is acted upon by the cammed surface 22 of a rotatable sleeve 14. A further bracket (not shown) mounted on a pivot on the base-plate 7 has a finger engaging the plate 8 to ensure that the chamber is kept in the same plane while it is pivoted. Locating studs for the chamber on the plate 8 and for the chamber relative to the analyzer body 3 are also provided. |
