发明名称 INSPECTION OF DEFECTIVE RETICLE
摘要 PURPOSE:To make it feasible to detect any pinholes around a reticle within a short time by a method wherein, in order to detect the pinholes around a pattern whereon no design data are situated, a region equivalent to the detected width or 1/integer thereof or a little bit larger is projected and irradiated on a senser to detect the pinholes. CONSTITUTION:The regions 1, 2, 3, 4, 5 and 6 respectively representing the regions mentioned as follows are to be detected in pinholes i.e. a region whereon a pattern is actually situated, a region provided for design data, a region containing dicing lines, a region irradiated with a skipper, a region dicing lined, a region to be pinholes free. After finishing the inspection of region 2, the region 6 is inspected by the process other than that for the region 2 utilizing pinhole detecting senser and circuit e.g. by means of irradiating a region 7 at one time and moving the inspecting region (region 7) in the arrow direction to perform the pinhole detection within a short time. Through these procedures, any useless further inspection may be skipped to save the required time if any pinholes exceeding specified numbers are once detected.
申请公布号 JPS61119034(A) 申请公布日期 1986.06.06
申请号 JP19840239472 申请日期 1984.11.15
申请人 TOSHIBA CORP 发明人 SASAKI SADAO
分类号 G01N21/88;G01N21/956;G03F1/84;H01L21/027;H01L21/30;H01L21/66 主分类号 G01N21/88
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