发明名称 METHOD FOR INSPECTING SHORTCIRCUIT INFERIORITY OF MULTI-TERMINAL ELEMENT
摘要 PURPOSE:To make it possible to complete the inspection of all terminals by (n-1) inspections if an n-terminal element is inspected, by collectively inspecting the presence of continuity between one terminal and remaining terminals one time. CONSTITUTION:In inspecting inferiority due to shortcircuit between terminals of a 7-segment LED element 1 having 8 terminals A-H, at first, the voltage of a DC power source 3 is applied between the terminal A and the terminals B-H by closing a contact (a) and contacts (j)-(p) and non-continuity between the terminal A and the other terminals is confirmed by an ammeter 4. Next, by closing the contact (b) and contacts (i), (k)-(p), non-continuity between the terminal B and the terminals A, C-H is confirmed by the ammeter 4. Hereinbelow, the contacts are successively closed and non-continuity between each terminal and the other terminals is confirmed. When continuity is confirmed between any terminals, the LED element 1 is excluded as an inferior product.
申请公布号 JPS61118668(A) 申请公布日期 1986.06.05
申请号 JP19840241999 申请日期 1984.11.15
申请人 ROHM CO LTD 发明人 SHIBA MASASHI
分类号 G01R31/02 主分类号 G01R31/02
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