发明名称 PLASMA CHEMICAL VAPOR DEPOSITION APPARATUS
摘要 PURPOSE:To enable the formation of scratchless films on semiconductor wafer surfaces by a method wherein the susceptor of a P-CVD apparatus is provided with a two-step recess, and a wafer is fixed by the upper recess and the recess shoulder. CONSTITUTION:A vacuum chamber 1 contains the upper electrode 2 and the lower electrode 3, so that a P-CVD film can be formed by impressing voltage on introduction of reaction gas from the upper electrode. The top of the susceptor 3 is provided with a two-step recess. Its upper step 8 is shaped so as to fix the wafer and is smaller in depth than the thickness of the wafer. The lower step 9 is smaller than the upper step 8, and the shoulder is formed between the upper step 8 and the lower step 9. Films are formed by fixing the wafer through fitting to the upper step 8 with the film-forming surface turned upward. This apparatus allows no deposits on the recess shoulder because it is always covered with the wafer.
申请公布号 JPS61117838(A) 申请公布日期 1986.06.05
申请号 JP19840239883 申请日期 1984.11.14
申请人 SUMITOMO ELECTRIC IND LTD 发明人 SHIMAZU MITSURU
分类号 H01L21/31;(IPC1-7):H01L21/31 主分类号 H01L21/31
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