Device for testing components

摘要

A device for testing electronic components is proposed by means of which it is possible to test the components which are arranged between two points, completely automatically. Testing takes place using an AC voltage which prevents a specified current being exceeded and has a predetermined frequency. It is possible to determine the characteristics of the item under test very precisely by evaluating the individual half cycles and detecting the current flowing in that case, and on the basis of the phase relationship between the voltage and current on the item under test. <IMAGE>