| 摘要 |
<p>A photometer adapted to receive light deflected from a microscope observation axis (15) to alternatively provide image or wavelength scanning modes. The photometer comprises an entrance axis (29) for light received from the microscope, a pin hole occluder (12) positioned at one end of the entrance axis (29), a detector axis (27) having a detector (18) at one end thereof, and first and second scanning axes (16, 28) selectively connecting the entrance axis (29). The first scanning axis (16) is provided with a first imaging means (14) positioned thereon for imaging the pin hole occluder (12 near said detector (18). The second scanning axis (28) is provided with monochromator means (32) to reflect a single wavelength of light and a second imaging means for imaging the pin hold occluder (12) near the detector (18). The photometer also includes selector means (26) for connecting a chosen scanning axis (16, 28) to said entrance and detector axes (29, 27). By means of this arrangement image scanning can be performed when said first scanning axis (16) connects said entrance and detector axes (29, 27), and wavelength scanning can be performed when said second scanning axis (28) connects said entrance and detector axes (29, 27).</p> |
