| 摘要 |
<p>A test voltage is applied through an array of "guarded" switches (58) to selected ones of a plurality of components to be measured. Each switch (58) comprises first and second input terminals (69, 72), first and second output terminals (70, 74), and a wire (76) interconnecting the second input and second output terminals (72, 74). The switch (58) is operable selectively in a first state interconnecting its first input and output terminals (69, 70) and in a second state interconnecting the second input and output terminals (72, 74). A buffer amplifier (88) couples the input signal from the first input terminal (69) to the wire (76) interconnecting the second and output terminals (72, 74) of the switch (58) as a "guard voltage" to prevent loading of the input signal by leakage resistances within the switch.</p> |
