发明名称 Charged particle energy spectrometer
摘要 A charged particle energy spectrometer, typically an electron spectrometer, comprising an electrostatic dispersive charged particle analyzer, e.g. a substantially hemispherical sector analyzer (1,6), and a detector means comprising a plurality of charged particle detectors (26-28) is described. Fringing fields at the exit of the analyzer are corrected by a fringing field corrector plate (7) containing a plurality of apertures (20, 22, 23) each aligned with one channel of the detector means. Exit beam defining slits (21, 24, 25) in a plate (12) situated in the exit focal plane of the analyzer may optionally be provided. Each aperture (20, 22, 23) is preferably the same size and shape as the single aperture used to achieve optimum correction of the fringing fields in a conventional spectrometer having a single channel detector. One or more position sensitive detectors may be used in place of some or all of the detectors (26-28).
申请公布号 US4593196(A) 申请公布日期 1986.06.03
申请号 US19840641203 申请日期 1984.08.16
申请人 VG INSTRUMENTS GROUP LIMITED 发明人 YATES, KENNETH
分类号 H01J49/44;H01J49/02;H01J49/48;(IPC1-7):H01J40/00 主分类号 H01J49/44
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