发明名称 Method for forming uniformly thick selective epitaxial silicon
摘要 Monocrystalline silicon is deposited on first and second portions of a substrate, the first and second portions having substantially unequal dimensions. The method comprises subjecting the substrate to a silicon-source gas and a predetermined concentration of chloride at a predetermined temperature. The chloride concentration is selected so as to create a substantially equally thick monocrystalline silicon deposit on each of the substrate portions.
申请公布号 US4592792(A) 申请公布日期 1986.06.03
申请号 US19850694100 申请日期 1985.01.23
申请人 RCA CORPORATION 发明人 CORBOY, JR., JOHN F.;JASTRZEBSKI, LUBOMIR L.
分类号 C30B25/04;C30B29/06;H01L21/20;H01L21/205;H01L21/762;(IPC1-7):H01L21/205;H01L21/76 主分类号 C30B25/04
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