发明名称 APPARATUS FOR INSPECTING RADIATION
摘要 PURPOSE:To provide automatic radiation inspection apparatus generating no setting error, by automatically measuring the distance between a radiation source and an article to be inspected by an ultrasonic wave or laser and automatically setting an irradiation time and voltage from the material quality of the article to be inspected and a film condition. CONSTITUTION:When an X-ray generation apparatus 3 is arranged so as to be opposed to an article 8 to be inspected, an ultrasonic wave 6 is sent to the article 8 to be inspected from an ultrasonic transmitter receiver 4 and the time required from the emission of the ultrasonic wave to the returning of the reflected wave thereof to said transmitter receiver 4 is measured to calculate an irradiation distance. A controller 1 calculates X-ray generating voltage and an irradiation time from the calculated irradiation distance and set conditions such as the thickness of a plate to be subjected to flaw detection, material quality or the kind of a film and controls an X-ray controller 2. X-rays 5 are generated by the set control condition of said controller 2 to pick up an image. When values other than the variables mentioned below are set so as to be constant, formula T=D<2>K/I (wherein I is the current of an X-ray tube, T is the irradiation time, D is the irradiation distance and K is the constant determined by a set condition) is generally formed and therefore, utilized as a fundamental formula.
申请公布号 JPS61112949(A) 申请公布日期 1986.05.30
申请号 JP19840234160 申请日期 1984.11.08
申请人 TOSHIBA CORP 发明人 OKUYAMA NOBUHIKO
分类号 G01B15/00;G01N23/18;G03B42/02 主分类号 G01B15/00
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