发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE:To increase the area of a MOS capacitor by length on a pattern without deepening a groove in the MOS capacitor by arranging said groove in a shape with a manner that the groove surrounds the periphery of a MOS transistor region. CONSTITUTION:An insulating film consisting of a section surrounding the whole memory cell region and a section 22 formed into the section 21 to a U-shape and a capacitor groove 3 surrounding a MOS transistor forming region surrounded by the film 22 are formed to a p<-> type Si substrate 1, and an n type layer 4 as a substrate-side electrode for a capacitor is shaped onto the base and side surface of the capacitor groove 3. A capacitor electrode 6, a gate electrode 8 through a gate insulating film 7 and n<+> type layers 9, 10 as a drain and a source are formed, an insulating film 11 is deposited onto the whole upper surfaces of the electrodes 6, 8 and the layers 9, 10, a contact hole is bored to the film 11, an Al wiring 12 is shaped and used as a bit line, and the electrode 8 is employed as a word line.
申请公布号 JPS61107764(A) 申请公布日期 1986.05.26
申请号 JP19840229211 申请日期 1984.10.31
申请人 TOSHIBA CORP 发明人 NITAYAMA AKIHIRO
分类号 H01L27/10;H01L21/8242;H01L27/108 主分类号 H01L27/10
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