发明名称 |
A METHOD FOR FABRICATING SEMICONDUCTOR DEVICE |
摘要 |
A method for fabricating a semiconductor device includes a step of selectively plasma etching an insulating film or a conductor film (5) and thereafter heat treating the entire structure at a temperature above 250 DEG C, so that adhesion between the exposed surface of an insulating film (2) and a resist film (6) to be formed later may be improved. Since the adhesion between the resist film (6) and the insulating film (2) is excellent, an opening (7) of good shape precision may be formed. |
申请公布号 |
DE3174421(D1) |
申请公布日期 |
1986.05.22 |
申请号 |
DE19813174421 |
申请日期 |
1981.11.26 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
KOMATSU, SHIGERU;NAKAMURA, MICHIO |
分类号 |
H01L21/302;H01L21/3065;H01L21/3105;H01L21/312;H01L21/321 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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