发明名称 FORMATION OF PATTERN POLYMER DIELECTRIC LAYER EMPLOYING POLYMERIZABLE OLIGOMER AND POLYMERIZABLE OLIGOMER ITSELF
摘要 The photosensitivity of a particular group of polymerizable oligomers permits radiation induced polymerization. This photosensitivity thus enables the polymerizable oligomers to be used as photoresists in general, and facilitates in situ cure when the oligomers are used to produce isolation films and trenches in semiconductor devices. The photosensitivity further enables use of a simplified planarization process when the polymerizable oligomers are used in the fabrication of semiconductor structures and integrated circuit components. Specifically, the polymerizable oligomers are comprised of poly N-substituted amic acids, the corresponding amic esters, the corresponding amic isoimides, the corresponding amic imids or mixtures thereof, wherein the end groups of the polymerizable oligomer are end capped with a vinyl or acetylinic end group.
申请公布号 JPS6197930(A) 申请公布日期 1986.05.16
申请号 JP19850157150 申请日期 1985.07.18
申请人 INTERNATL BUSINESS MACH CORP 发明人 KONSUTANSU JIYOON ARAPUSU;JIYOOJI CHIYOONNIYU;SUCHIIBUN EMU KANDETSUKE;MAAKU ANSONII TAKAKUSU
分类号 C08G73/10;H01L21/31;H01L21/312;H01L21/762 主分类号 C08G73/10
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