发明名称 |
Impedance matched test probe |
摘要 |
A probe for coupling electrical test equipment to a selected point of an electrical device has a spring loaded rigid pin 32 for contacting the selected point, connected to a wave guide comprising a coaxial cable 44 of substantially constant characteristic impedance for coupling the test equipment to the pin. A second probe tip 62 is attached to spring biassed sleeve 60 which is in turn connected to the outer conductor of the cable. In a second embodiment a flexible dielectric board 15 is provided on its lower surface with conductor strips 13 which connect the probe tips to coaxial cables 31. A support member 25 acts as a ground plane and the arrangement is such that the impedance characteristics of the strips 13 and member 25 are matched to that of the cables 31. <IMAGE> |
申请公布号 |
GB2166913(A) |
申请公布日期 |
1986.05.14 |
申请号 |
GB19850023685 |
申请日期 |
1985.09.25 |
申请人 |
* TEKTRONIX INC |
发明人 |
JON C * MANOR;IRA G * POLLOCK |
分类号 |
G01R31/26;G01R1/067;H01R9/05;H01R11/18;(IPC1-7):H01R9/11 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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