| 发明名称 |
MEMORY TESTING APPARATUS |
| 摘要 |
A testing apparatus, having an address generator for providing address signals to a test device and to a reference device, is provided with a programmable mask for passing only selected least significant X and Y address bits to the reference device. |
| 申请公布号 |
EP0054692(B1) |
申请公布日期 |
1986.05.14 |
| 申请号 |
EP19810108973 |
申请日期 |
1981.10.27 |
| 申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
JONES, ROBERT E.;WOOD, DONALD H. |
| 分类号 |
G11C29/00;G01R31/28;G11C29/56 |
主分类号 |
G11C29/00 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
|
| 地址 |
|
