发明名称 Schottky gate field effect transistor and manufacturing method thereof.
摘要 <p>In a GaAs field effect transistor of the invention, a gate layer (14) is formed on a semi-insulative substrate (10). The gate layer (14) is made of a conductive material forming a Schottky junction between the substrate (10) and the gate layer. Source and drain regions (16, 18) are formed in the substrate (10) to have a first conductivity type. Barrier layers (24, 26) are formed in the substrate (10) to have a second conductivity type. The barrier layers (24, 26) are formed to surround the source and drain regions (16,18), and suppress a current component from leaking from the source and drain regions (16, 18) to the substrate (10) when the field effect transistor is operative.</p>
申请公布号 EP0181091(A2) 申请公布日期 1986.05.14
申请号 EP19850307110 申请日期 1985.10.03
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 TERADA, TOSHIYUKI C/O PATENT DIVISION K.K. TOSHIBA;HIROSE, MAYUMI C/O PATENT DIVISION K.K. TOSHIBA;ISHIDA, KENJI C/O PATENT DIVISION K.K. TOSHIBA
分类号 H01L21/338;H01L29/10;H01L29/812;(IPC1-7):H01L29/08;H01L21/265;H01L29/80 主分类号 H01L21/338
代理机构 代理人
主权项
地址