发明名称 Semiconductor device monolithically comprising a V-MOSFET and bipolar transistor isolated from each other
摘要 A semiconductor device comprising a high voltage withstanding vertical MOSFET and a low voltage withstanding element both formed on a single chip. A buried layer of a high impurity concentration is formed in a region where the vertical MOSFET is formed, and another buried layer of a high impurity concentration is formed in a region where the low voltage withstanding element is formed. These buried layers have different thickness, whereby the series resistance of a circuit adjacent to the vertical MOSFET is reduced without lowering the withstand voltage of the vertical MOSFET.
申请公布号 US4589004(A) 申请公布日期 1986.05.13
申请号 US19840665506 申请日期 1984.10.30
申请人 TOKYO SHIBAURA DENKI KABUSHIKI KAISHA 发明人 YASUDA, SEIJI;YONEZAWA, TOSHIO;HIRAKI, SHUNICHI;MIYAGAWA, MASAFUMI
分类号 H01L21/74;H01L21/761;H01L21/8249;H01L27/06;H01L29/08;H01L29/78;(IPC1-7):H01L29/78;H01L27/02 主分类号 H01L21/74
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