发明名称 METHOD FOR FORMING AN ISOLATION REGION FOR ELECTRICALLY ISOLATING ELEMENTS
摘要 <p>METHOD FOR FORMING AN ISOLATION REGION FOR ELECTRICALLY ISOLATING ELEMENTS A method for forming an isolation region having a submicron width thereof in a semiconductor substrate comprising the steps of: forming a metal or a metal silicide layer on the semiconductor substrate; then forming a resist layer on the metal or metal silicide layer; patterning the resist layer; selectively etching the metal or metal silicide layer and the semiconductor substrate by the reactive ion etching process using a mixture of chlorine-containing gas and oxygen gas to form a groove in the surface portion of the semiconductor substrate located around the edge of the resist layer; and forming an insulating layer in the groove.</p>
申请公布号 CA1204525(A) 申请公布日期 1986.05.13
申请号 CA19830440422 申请日期 1983.11.04
申请人 FUJITSU LIMITED 发明人
分类号 H01L21/32;B44C1/22;C03C15/00;H01L21/033;H01L21/308;H01L21/762;H01L21/763 主分类号 H01L21/32
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