发明名称 Diffusion of dopant into a semiconductor wafer
摘要 A process for doping a semiconductor material is performed during a deposition phase in a plurality of steps, first at a relatively low temperature to form a high concentration glass formation layer of the dopant on a semiconductor wafer at a high rate, and then raising the temperature slowly to provide an initial drive-in of the dopant. After etch removal of excess glass formation, the wafers are subjected to a base diffusion at an elevated temperature in an oxidizing atmosphere.
申请公布号 US4588454(A) 申请公布日期 1986.05.13
申请号 US19840684758 申请日期 1984.12.21
申请人 LINEAR TECHNOLOGY CORPORATION 发明人 KHADDER, WADIE N.;WANG, JIA-TARNG
分类号 H01L21/225;H01L21/311;(IPC1-7):H01L21/385 主分类号 H01L21/225
代理机构 代理人
主权项
地址