| 摘要 |
PURPOSE:To detect an extremely slight amt. of uranium elements with high accuracy by subjecting sodium fluoride contg. the uranium element to wavelength scanning at the specified wavelength difference provided between excitation light and detection light. CONSTITUTION:The light from a light source 1a is passed through a diffraction grating filter 1b and an optional wavelength is taken out in an excitation light emitting part 1. The light from a sample chamber 3 is subjected to wavelength selection by a diffraction grating filter 2a and is converted to an electric signal by a photodetector 2b in a fluorescent light detecting part 2. On the other hand, the sample chamber 3 is disposed on the optical path connecting the light emitting part 1 and the photodetecting part 2 and is so arranged that the wavelength scanning is executed while the specified wavelength difference is maintained between the filters 1b and 2a by a motor 4. The NaF-KCO3 flux eluted with uranium in the sample is imposed in the sample chamber 3 and while the wavelength of the excitation light is changed in one direction, the light from the sample S is detected at the specified wavelength difference provided with the excitation light. |
