发明名称 MASS ANALYZING SYSTEM
摘要 PURPOSE:To enable to set plural ions on the intermediate slit, by recording spectra in scanning an ion accelerating voltage and the first and second electric field voltages at the magnetic field portion where a specific mass value has been reset, so as to compensate errors from the magnetic field reset value. CONSTITUTION:On the intermediate slit 5 of the first mass analyzing position in a tandem type mass analyzing system, a specific mass value is reset by a magnetic field 4 where the ion accelerating voltage 12, the voltage 13 of the first electric field 3, and the voltage 15 of the second electric field 7 are scanned, and the resultant spectra are recorded in CRT10. Then errors from the magnetic field reset value are red and three values of the accelerating voltage, and the first and second electric field voltages are compensated connectedly, and the energy spectra are measured assuming the voltage of the compensated second electric field 7 is at 100%. Thus, plural ions can be set on the intermediate slit 5, and energy spectra of plural specific ions can be continuously measured.
申请公布号 JPS6188443(A) 申请公布日期 1986.05.06
申请号 JP19840208213 申请日期 1984.10.05
申请人 HITACHI LTD 发明人 HIROSE HIROSHI
分类号 G01N27/62;H01J49/02;H01J49/26;H01J49/32;(IPC1-7):H01J49/26 主分类号 G01N27/62
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