发明名称 |
Arrangement for testing micro interconnections and a method for operating the same |
摘要 |
An arrangement for electrically testing microinterconnections with electric test contacts may be used given drastically-reduced dimensions of electric conductors and of the grid dimensions in printed circuitboards. The electric test contacts are selectable by way of internal switches. The test contacts can be disposed in a matrix whose grid dimension corresponds to the grid dimension of a printed circuitboard to be tested.
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申请公布号 |
US4587481(A) |
申请公布日期 |
1986.05.06 |
申请号 |
US19830504742 |
申请日期 |
1983.06.16 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
LISCHKE, BURKHARD;FROSIEN, JUERGEN;SCHMITT, REINHOLD |
分类号 |
G01R31/02;G01R1/073;G01R31/28;(IPC1-7):G01R15/12 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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