| 摘要 |
Method for detecting defects such as superficial microfissures in the surface of a solid die esp. a carbon based or metallic die comprises molecular activation of the said die surface using a high frequency electromagnetic field and simultaneous irradiation of the surface of the die with a laser beam the source of which is fixed, guided so that it is reflected on the surface and strikes a visualisation element, permitting detection of the surface defects according to the displacement of the die w.r.t., the laser beam.
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