发明名称 DEVICE FOR MEASURING SCATTERING INTENSITY OF SAMPLE
摘要 PURPOSE:To eliminate the measurement error occurring in the sensitivity change of a detector and to obtain the exact absolute scattering intensity by detecting the quantity of light before the irradiation of said light on a sample and the quantity of the light scattered by a sample by the same detector. CONSTITUTION:The laser light from a laser light source 1 is conducted to the 1st mirror 2, the 2nd mirror 3, a condenser lens 4 and a window 5 for transmission of laser light to a sample cell 6. The scattered light from the cell 6 is conducted through a pinhole member 7, a main prism 8 and a pinhole member 9 to a detector 10. The cell 6 is supported in the central part of a goniometer and a main prism 8 is attached to the inside of the casing suspended downward toward the peripheral edge. A detector 10 is attached to the inside of the casing erected upward so as to face diametrically the casing. Only the slight light is then conducted through the pinhole member 9 to the detector 10 when the main prism 8 is positioned between the window 5 and the cell 6 by rotating the goniometer.
申请公布号 JPS6184547(A) 申请公布日期 1986.04.30
申请号 JP19840206840 申请日期 1984.10.02
申请人 UNION GIKEN:KK 发明人 OKA KOICHI;NAKAMURA SHOICHI;KUBO YASUHIRO
分类号 G01N21/51;(IPC1-7):G01N21/51 主分类号 G01N21/51
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