| 摘要 |
A random access type semiconductor memory comprises a plurality of word lines (44; 54) of a metal arranged in parallel, at least first to fourth bit lines (BL1, BL2, BL1, BL2) orthogonal to the word lines, a plurality of memory cells (48; 58a, 58b), each of which is arranged corresponding to one of cross points between each of the word lines and each of the bit lines, a first sense amplifier (SA1) connected to the first and third bit lines (BL1, BL1) and a second sense amplifier (SA2) connected to the second and fourth bit lines (BL2, BL2). The first sense amplifier (SA1) amplifies a voltage applied to said first or third bit line from a selected first memory cell and the second sense amplifier (SA2) amplifies a voltage applied to the second or fourth bit line from a selected second memory cell.
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