发明名称 X-RAY PHOTO ELECTRON ANALYSIS DEVICE
摘要 PURPOSE:To make possible the measurement with an exact chemical shift and high resolving power even with an insulator by measuring the electrons arriving at a grid provided in proximity to a sample and impressing a negative voltage to the grid according to the quantity of the electrons. CONSTITUTION:The electrons 4 from the surface of the sample 2 are released by the X-rays 11 from an X-ray gun 10. When the electrons 14 pass near the grid 16, part of the electrons 14 are captured by the grid 16 and the impulsive signal thereof pass through a capacitor C and is counted by an electron counter 18, by which the electron intensity is read. A negative voltage from a voltage generator 20 is impressed to the grid 16 according to the electron intensity thereof and the electrons 22 below the negative voltage are turned back.The negative voltage is higher and the electrons turned back are more as the electrons released from the sample 2 are more.The potential difference by the electrification is thus made zero.
申请公布号 JPS6182151(A) 申请公布日期 1986.04.25
申请号 JP19840204602 申请日期 1984.09.28
申请人 SHIMADZU CORP 发明人 YAMAUCHI HIROSHI
分类号 H01J37/252;G01N23/227 主分类号 H01J37/252
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