发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To obtain a transistor with the reduced gate resistance and the intentionally contrived and improved efficiency by a method wherein the gate electrode with the section, which is roughly formed in the shape of the T letter of the alphabet, is formed and the ohmic electrodes of the source and the drain are formed in a self-alignment manner. CONSTITUTION:A resin layer is applied on an active layer 12 consisting of a one conductive type semiconductor 11, a part of the resin layer is removed by performing an etching and a first tungsten metal layer is coated on the active layer made to expose. Then, a second titan metal layer and a third gold metal layer are coated thicker than the resin layer at the gate opening part. A gate electrode 27 with the section, which is formed in an almost T shape, is formed by a process, wherein the metal layers are etched, and a lift-off method, wherein the resin layer is removed by performing an etching, then, an ohmic metal layer 24 is coated and the ohmic electrodes of a source 25 and a drain 26 are formed in a self-alignment manner.
申请公布号 JPS6180869(A) 申请公布日期 1986.04.24
申请号 JP19840202314 申请日期 1984.09.27
申请人 NEC CORP 发明人 ITO HITOSHI
分类号 H01L29/812;H01L21/338;H01L29/423 主分类号 H01L29/812
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