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发明名称
METHOD OF TESTING PHYSICAL-AND-MECHANICAL CHARACTERISTICS OF SEMICONDUCTOR PLATE DISTURBED SURFACE LAYER
摘要
申请公布号
SU1226069(A1)
申请公布日期
1986.04.23
申请号
SU19843757077
申请日期
1984.06.21
申请人
MI RADIOTEKHNICHESKIJ INSTITUT
发明人
POLONIN ALEKSANDR K,SU;DIDKOVSKIJ VITALIJ S,SU;MUZYCHENKO OLEG M,SU;KVASOV NIKOLAJ T,SU;PROKHORENKO NIKOLAJ L,SU
分类号
G01H13/00;(IPC1-7):G01H13/00
主分类号
G01H13/00
代理机构
代理人
主权项
地址
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