MEASURING METHOD OF HIGH FREQUENCY DIELECTRIC CHARACTERISTIC OF THIN FILM INSULATOR,申请号JP19840198043-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	MEASURING METHOD OF HIGH FREQUENCY DIELECTRIC CHARACTERISTIC OF THIN FILM INSULATOR
摘要
申请公布号	JPS6176964(A)	申请公布日期	1986.04.19
申请号	JP19840198043	申请日期	1984.09.21
申请人	NEC CORP	发明人	SUGIURA SADAHIKO
分类号	G01R27/26	主分类号	G01R27/26
代理机构		代理人
主权项
地址

您可能感兴趣的专利

SELF CALIBRATING PULSE WIDTH MODULATOR FOR USE IN ELECTROSTATIC PRINTING APPLICATIONS

Structural trusses

Footwear modification for roller skating

Improvements in and relating to consevatory roof structures and glazing bars therefor

Improvements in cone springs

An automated jukebox

Vehicle lift for disabled persons

Profile mechanical fastener

Knee supporting triangle

Improvements in and relating to fastener anchors

Improvements to plastic mini disc (MD) cases

Assault, rescue & recovery platform

Restraining device

Adaptiver predictive model in a process control system

Telephone cost controller with caller identification and anti-tamper system

Antenna switch arrangement

Therapeutic agents