发明名称 Measuring head for testing under points of circuits
摘要 The measuring head uses a sun consisting of a retaining ring 2 in which conducting pads 3, 4, 5 are mounted. The sun is installed in the same recess in a rigid support 10 as the printed circuit 11. The printed circuit carries conducting tracks 12 onto which the outer ends 3 of the conducting pads 3, 4, 5 are welded. The conducting tracks 12 extend as far as the connectors 14. <IMAGE>
申请公布号 FR2571861(A1) 申请公布日期 1986.04.18
申请号 FR19840015821 申请日期 1984.10.16
申请人 RADIOTECHNIQUE COMPELEC 发明人 DANIEL BESNEVILLE ET JEAN LUC LEFEBVRE;LEFEBVRE JEAN LUC
分类号 G01R1/073;(IPC1-7):G01R31/28 主分类号 G01R1/073
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