发明名称 INSPECTION SYSTEM
摘要 PURPOSE:To eliminate the need for storage of programs for inspection in the memory of equipment to be inspected and to prevent the constitution of the equipment from becoming complex by providing an inspecting device independent of the equipment to be inspected. CONSTITUTION:The equipment 10 to be inspected and inspecting device 30 are connected through connectors 29 and 49 and a CPU11 begins to operate. Access to the ROM12, etc., in the object equipment 11 is inhibited and the CPU1 operates according to the inspection program in the ROM32 of the inspecting device 30. When an access switching signal in the program is read out, an access switching signal is inverted from a level L to a level H through an I/O circuit 34. Consequently, access to the ROM12, etc., of the object equipment 10 is reset. The CPU11 accesses the ROM12 and when the program is executed by the specific number of steps, the access switching signal is inverted to the level L and the inspection program in the ROM32 is executed again.
申请公布号 JPS6174035(A) 申请公布日期 1986.04.16
申请号 JP19840196443 申请日期 1984.09.18
申请人 OMRON TATEISI ELECTRONICS CO 发明人 MIYAGAWA SATOSHI
分类号 G06F11/22 主分类号 G06F11/22
代理机构 代理人
主权项
地址
您可能感兴趣的专利