首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
SKIP MECHANISM OF PROBE FOR INSPECTING PIPE AND JOINT
摘要
申请公布号
JPS6170454(A)
申请公布日期
1986.04.11
申请号
JP19850177779
申请日期
1985.08.14
申请人
AMF INC
发明人
ERIZABESU EMU BEINZU
分类号
G01N27/82;G01B21/00;G01B21/08;G01B21/20;G01N29/04;G01N29/265
主分类号
G01N27/82
代理机构
代理人
主权项
地址
您可能感兴趣的专利
FUEL INJECTION VALVE FOR INTERNAL COMBUSTION ENGINE
Interferometric measurement apparatus for wavelength calibration
Method and apparatus for simultaneous measurement of the refractive index and thickness of thin films
Apparatus for transporting fluid ink, and a flexible hose suitable for such transportation apparatus
Curve smoothing without shrinking
Brake-transmission shift interlock device for an automatic transmission system
Voltage generation circuits and methods of operating same that use charge sharing to increase voltage step-up
CLOCK INDUCED SUPPLY NOISE REDUCTION APPARATUS FOR A LATCH BASED CIRCUIT
CONDITIONAL CLOCK GATE THAT REDUCES DATA DEPENDENT LOADING ON A CLOCK NETWORK
Manufacturing method and structure of OLED display panel
Long-life electron tube device, electron tube cathode, and manufacturing method for the electron tube device
Amortisseur vibration damper
Sulfur storage method and system
Brake installation with electropneumatic modulator
Method and apparatus for image forming capable of effectively generating pixel clock pulses
Printer device and method
Accelerated graphics port for a multiple memory controller computer system
Method of using twelve sensors to produce data
Method and system for generating a graphical representation
Guiding device for drawer
