| 摘要 |
Electronic and measuring circuits located remotely from the test head. A low device count circuit (20) at each pin (21) performs the necessary high speed switching. The force and measure lines are relatively long, but the signal rates are low enough to be accurately transmitted. The only high rate signals are on lines coupled to the gates of FET switches (25, 26, 30, 31, 35, 36) at the test head. Thus, multiple pin, high speed testing can be accomplished using relatively small and inexpensive test heads. |
