| 摘要 |
PURPOSE:To perform examination in a short time by an inexpensive structure, by inputting light from a white light source into a filter film to be examined through a reference filter film, changing the angle of one of two filter films with respect to the incident light, and detecting the transmitted light by a light detecting part. CONSTITUTION:Light emitted from a white light source 1 becomes a parallel light beam through a lens 2. The light beam is inputted to a light detecting part 5 through a reference filter film 3, which is inclined at an angle theta0, and a filter film 4 to be examined. The detected signal is processed by a detection processing part 6. The angle of the filter film 4 to be examined is changed between a position 4' at + theta and a position 4' at - theta with the position 4 at the angle theta0 as a center. The detected output is measured, and the incident angle dependence of the filter film 4 is measured. Thus, the examination can be performed in a short time by an inexpensive structure. |
