| 摘要 |
PURPOSE:To enable easy IC test without reading out an IC connecting condition from the circuit drawing, by compiling test data automatically by a connecting information of an IC specimen. CONSTITUTION:Test data corresponding to all connection conditions for each IC considered per IC kind are stored in a floppy disk 5 and for the IC test, a test probel is connected to all the pins of an actually prepared digital IC8 in a specimen package 7 and drawing it into a driver-receiver 2, and an item name of the IC8 is introduced from a keyboard 10. Thus, test data related to the IC8 are loaded in a memory unit 6 from the disk 5 and further, a CPU3 places a driver for connecting to the first pin of the IC8 in the 'ON' position and an electrical voltage is applied and other pin conditions are observed by the receiver 2 connected to each of the pin. This kind of drive voltage application and pin-condition observation are continued up to the last pin and from the result, the CPU3 reads out the test data of the IC8 judging and responding to the connecting condition of the IC8 from a memory unit 6. |
