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发明名称
TEST DEVICE FOR SEMICONDUCTOR MEMORY
摘要
申请公布号
JPS6164000(A)
申请公布日期
1986.04.02
申请号
JP19850185142
申请日期
1985.08.23
申请人
NEC CORP
发明人
MATSUOKA OSAMU
分类号
G01R31/3183;G11C29/00;G11C29/10
主分类号
G01R31/3183
代理机构
代理人
主权项
地址
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