Method of testing analog/digital converter and structure of analog/digital converter suited for the test

摘要

A method of testing a successive comparison type analog/digital converter which incorporates a voltage comparator, a register for successive comparison and a digital/analog converter. A reference digital signal is inputted to the incorporated digital/analog comparator to be converted into an analog signal, while a digital signal corresponding to the reference digital signal is inputted to an externally provided reference digital/analog converter to be converted into an analog signal. Both analog signals thus produced are compared with each other through the incorporated voltage comparator to thereby determine conversion accuracy. A successive comparison type analog/digital converter suited for the test includes further a change-over switch for introducing the externally supplied digital signal to the incorporated digital/analog converter and a changeover switch for leading outwardly the output signal from the voltage comparator.