发明名称 |
Method for producing field effect type semiconductor device |
摘要 |
A method for producing a field effect type semiconductor device includes the steps of forming a semiconductor active layer on a substrate, forming a resist layer on the semiconductor active layer, exposing a first portion of the resist layer in accordance with a gate electrode pattern, carrying out auxiliary exposure of a second portion near the first portion after or before the exposure of the first portion. The method further includes developing the exposed resist layer, forming a recess in the semiconductor active layer by etching the exposed semiconductor active layer using the resist layer as a mask and forming a gate electrode on the surface of the recess using the resist layer as a mask. This method improves the series resistance between the source electrode and the gate electrode, and also improves the Schottky withstand voltage between the drain electrode and the gate electrode.
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申请公布号 |
US4578343(A) |
申请公布日期 |
1986.03.25 |
申请号 |
US19850717477 |
申请日期 |
1985.03.28 |
申请人 |
FUJITSU LIMITED |
发明人 |
KOSEMURA, KINJIRO;YAMASHITA, YOSHIMI;NAKAYAMA, NORIAKI;YAMAMOTO, SUMIO |
分类号 |
H01L29/812;H01L21/027;H01L21/28;H01L21/338;H01L29/417;H01L29/80;(IPC1-7):G03C5/00 |
主分类号 |
H01L29/812 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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