发明名称 Method for producing field effect type semiconductor device
摘要 A method for producing a field effect type semiconductor device includes the steps of forming a semiconductor active layer on a substrate, forming a resist layer on the semiconductor active layer, exposing a first portion of the resist layer in accordance with a gate electrode pattern, carrying out auxiliary exposure of a second portion near the first portion after or before the exposure of the first portion. The method further includes developing the exposed resist layer, forming a recess in the semiconductor active layer by etching the exposed semiconductor active layer using the resist layer as a mask and forming a gate electrode on the surface of the recess using the resist layer as a mask. This method improves the series resistance between the source electrode and the gate electrode, and also improves the Schottky withstand voltage between the drain electrode and the gate electrode.
申请公布号 US4578343(A) 申请公布日期 1986.03.25
申请号 US19850717477 申请日期 1985.03.28
申请人 FUJITSU LIMITED 发明人 KOSEMURA, KINJIRO;YAMASHITA, YOSHIMI;NAKAYAMA, NORIAKI;YAMAMOTO, SUMIO
分类号 H01L29/812;H01L21/027;H01L21/28;H01L21/338;H01L29/417;H01L29/80;(IPC1-7):G03C5/00 主分类号 H01L29/812
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